Part Number Hot Search : 
N5819K MAX15068 D6433 5KE11 DTC143 TFR315C DUY09A IRL2910S
Product Description
Full Text Search
 

To Download CY7C1081DV33-12BAXI Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
  cy7c1081dv33 64-mbit (4 m 16) static ram cypress semiconductor corporation ? 198 champion court ? san jose , ca 95134-1709 ? 408-943-2600 document #: 001-53992 rev. *c revised may 4, 2011 features high speed ? t aa = 12 ns low active power ? i cc = 300 ma at 12 ns low complementary metal oxide semiconductor (cmos) standby power ? i sb2 = 100 ma operating voltages of 3.3 0.3 v 2.0-v data retention automatic power-down when deselected transistor-transistor logic (ttl)-compatible inputs and outputs easy memory expansion with ce 1 and ce 2 features available in pb-free 48-ball fine ball grid array (fbga) package functional description the cy7c1081dv33 is a high-performance cmos static ram organized as 4,194,304 words by 16 bits. to write to the device, take chip enables (ce 1 low and ce 2 high) and write enable (we ) inputs low. if byte low enable (ble ) is low, then data from i/o pins (i/o 0 through i/o 7 ) is written into the location specified on the address pins (a 0 through a 21 ). if byte high enable (bhe ) is low, then data from i/o pins (i/o 8 through i/o 15 ) is written into the location specified on the address pins (a 0 through a 21 ). to read from the device , take chip enables (ce 1 low and ce 2 high) and output enable (oe ) low while forcing the write enable (we ) high. if byte low enable (ble ) is low, then data from the memory location specified by the address pins appears on i/o 0 to i/o 7 . if byte high enable (bhe ) is low, then data from memory appears on i/o 8 to i/o 15 . see the truth table on page 9 for a complete description of read and write modes. the input and output pins (i/o 0 through i/o 15 ) are placed in a high impedance state when the device is deselected (ce 1 high or ce 2 low), the outputs are disabled (oe high), both byte high enable and byte low enable are disabled (bhe , ble high), or during a write operation (ce 1 low, ce 2 high, and we low). i/o 0 ?i/o 7 row decoder sense amps data in drivers oe i/o 8 ?i/o 15 we ble bhe column decoder 4m 16 ram array a (10:0) a (21:11) logic block diagram ce 2 ce 1 [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 2 of 13 contents selection guide ................................................................ 3 pin configuration ............................................................. 3 maximum ratings............................................................. 4 operating range............................................................... 4 dc electrical characteristics .......................................... 4 capacitance ...................................................................... 4 thermal resistance.......................................................... 4 data retention characteristics ....................................... 5 ac switching characteristics ......................................... 6 switching waveforms ...................................................... 7 truth table ........................................................................ 9 ordering information ..................................................... 10 ordering code definition........ ................................... 10 package diagrams ......................................................... 11 acronyms........................................................................ 11 document conventions ................................................. 11 units of measure ....................................................... 11 document history page................................................. 12 sales, solutions, and legal information ...................... 12 worldwide sales and design support.......... ............. 12 products .................................................................... 12 psoc solutions ......................................................... 12 [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 3 of 13 selection guide description ?12 unit maximum access time 12 ns maximum operating current 300 ma maximum cmos standby current 100 ma pin configuration figure 1. 48-ball fbga (top view) we a 11 a 10 a 6 a 0 a 3 ce 1 i/o 10 i/o 8 i/o 9 a 4 a 5 i/o 11 i/o 13 i/o 12 i/o 14 i/o 15 v ss a 9 a 8 oe a 7 i/o 0 bhe ce 2 a 17 a 2 a 1 ble i/o 2 i/o 1 i/o 3 i/o 4 i/o 5 i/o 6 i/o 7 a 15 a 14 a 13 a 12 a 20 a 18 a 19 3 26 5 4 1 d e b a c f g h a 16 a 21 v cc v cc v ss [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 4 of 13 maximum ratings exceeding maximum ratings may impair the useful life of the device. these user guidelines are not tested. storage temperature ..................................... ?65 ? c to +150 ? c ambient temperature with power applied ................................................ ?55 ? c to +125 ? c supply voltage on v cc relative to gnd [1] ........ ?0.5 v to +4.6 v dc voltage applied to outputs in high-z state [1] ........................................?0.5 v to v cc + 0.5 v dc input voltage [1] ....................................?0.5 v to v cc + 0.5 v current into outputs (low) ..............................................20 ma static discharge voltage........... ......................................>2001 v (mil-std-883, method 3015) latch up current ...........................................................>140 ma operating range range ambient temperature v cc speed industrial ?40 c to +85 c 3.3 v ? 0.3 v 12 ns dc electrical characteristics over the operating range parameter description test conditions ?12 unit min max v oh output high voltage v cc = min, i oh = ?4.0 ma 2.4 ? v v ol output low voltage v cc = min, i ol = 8.0 ma ? 0.4 v v ih input high voltage 2.0 v cc + 0.3 v v il input low voltage [1] ?0.3 0.8 v i ix input leakage current gnd < v in < v cc ?1 +1 ? a i oz output leakage current gnd < v out < v cc , output disabled ?1 +1 ? a i cc v cc operating supply current v cc = max, f = f max = 1/t rc, i out = 0 ma cmos levels ? 300 ma i sb1 automatic ce power-down current ? ttl inputs max v cc , ce 1 > v ih , ce 2 < v il , v in > v ih or v in < v il , f = f max ?120ma i sb2 automatic ce power-down current ? cmos inputs max v cc , ce 1 > v cc ? 0.3 v, ce 2 < 0.3 v, v in > v cc ? 0.3 v, or v in < 0.3 v, f = 0, ?100ma capacitance tested initially and after any design or process changes that may affect these parameters. parameter description test conditions max unit c in input capacitance t a = 25 ? c, f = 1 mhz, v cc = 3.3 v 32 pf c out i/o capacitance 40 pf thermal resistance tested initially and after any design or process changes that may affect these parameters. parameter description test conditions fbga unit ? ja thermal resistance (junction to ambient) still air, soldered on a 3 4.5 inch, four-layer printed circuit board 55 ? c/w ? jc thermal resistance (junction to case) 23.04 ? c/w note 1. v il (min) = ?2.0 v and v ih (max) = v cc + 2 v for pulse durations of less than 20 ns. [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 5 of 13 figure 2. ac test loads and waveforms [2] data retention characteristics over the operating range parameter description conditions min typ max unit v dr v cc for data retention 2 ? ? v i ccdr data retention current v cc = 2 v, ce 1 > v cc ? 0.2 v, ce 2 < 0.2 v, v in > v cc ? 0.2 v or v in < 0.2 v ??100ma t cdr [3] chip deselect to data retention time 0??ns t r [4] operation recovery time 12 ? ? ns figure 3. data retention waveform 90% 10% 3.0 v gnd 90% 10% all input pulses 3.3 v output 5 pf* including jig and scope (b) r1 317 ? r2 351 ? rise time: fall time: > 1 v/ns (c) output 50 ? z 0 = 50 ? v th = 1.5 v 30 pf* * capacitive load consists of all components of the test environment high-z characteristics: (a) > 1 v/ns 3.0 v 3.0 v t cdr v dr > 2 v data retention mode t r ce 1 v cc ce 2 notes 2. valid sram operation does not occur until the power supplies reach the minimum operating v dd (3.0 v). 100 ? s (t power ) after reaching the minimum operating v dd , normal sram operation begins to include reduction in v dd to the data retention (v ccdr , 2.0 v) voltage. 3. tested initially and after any design or proce ss changes that may affect these parameters. 4. full device operation requires linear v cc ramp from v dr to v cc (min) > 50 ? s or stable at v cc (min) > 50 ? s. [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 6 of 13 ac switching ch aracteristics over the operating range [5] parameter description ? 12 unit min max read cycle t power v cc (typ) to the first access [6] 100 ? ? s t rc read cycle time 12 ? ns t aa address to data valid ? 12 ns t oha data hold from address change 3 ? ns t ace ce 1 low and ce 2 high to data valid ? 12 ns t doe oe low to data valid ? 7 ns t lzoe oe low to low-z 1 ? ns t hzoe oe high to high-z [7] ?7ns t lzce ce 1 low and ce 2 high to low-z [7] 3?ns t hzce ce 1 high and ce 2 low to high-z [7] ?7ns t pu ce 1 low and ce 2 high to power-up [8] 0?ns t pd ce 1 high and ce 2 low to power-down [8] ?12ns t dbe byte enable to data valid ? 7 ns t lzbe byte enable to low-z 1 ? ns t hzbe byte disable to high-z ? 7 ns write cycle [9, 10] t wc write cycle time 12 ? ns t sce ce 1 low and ce 2 high to write end 9 ? ns t aw address setup to write end 9 ? ns t ha address hold from write end 0 ? ns t sa address setup to write start 0 ? ns t pwe we pulse width 9 ? ns t sd data setup to write end 7 ? ns t hd data hold from write end 0 ? ns t lzwe we high to low-z [7] 3?ns t hzwe we low to high-z [7] ?7ns t bw byte enable to end of write 9 ? ns notes 5. test conditions are based on signal transition time of 3 ns or less and timing reference levels of 1.5 v and input pulse leve ls of 0 to 3.0 v. test conditions for the read cycle use output loading shown in part a) of ac test loads and waveforms [2] , unless specified otherwise. 6. t power is the minimum amount of time that the power supply must be at typical v cc values until the first memory access can be performed. 7. t hzoe , t hzce , t hzwe , t hzbe and t lzoe , t lzce , t \lzwe , t lzbe are specified with a load capacitance of 5 pf as in (b) of ac test loads and waveforms [2] . 8. these parameters are guaranteed by design and are not tested. 9. the internal memory write time is defined by the overlap of we , ce 1 = v il , and ce 2 = v ih . chip enables must be active and we and byte enables must be low to initiate a write, and the transition of any of these signals can terminate the write. the input data setup and hold timing must be referenced to the leading edge of the signal that terminates the write. 10. the minimum write cycle time for write cycle 2 (we controlled, oe low) is the sum of t hzwe and t sd . [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 7 of 13 switching waveforms figure 4. read cycle 1 (address transition controlled) [11, 12] figure 5. read cycle 2 (oe controlled) [12, 13, 14] previous data valid data valid t rc t aa t oha address data out 50% 50% data valid t rc t ace t doe t lzoe t lzce t pu high impedance t hzoe t hzbe t pd t dbe t lzbe t hzce oe ce address data out v cc supply bhe , ble current high impedance i cc i sb notes 11. device is continuously selected. oe , ce 1 = v il , bhe or bhe or both = v il , and ce 2 = v ih . 12. we is high for read cycle. 13. address valid before or similar to ce 1 transition low and ce 2 transition high. 14. ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other combinations, ce is high. [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 8 of 13 figure 6. write cycle 1 (ce controlled) [15, 16, 17] figure 7. write cycle 2 (we controlled, oe low) [15, 16, 17] switching waveforms (continued) t hd t sd t sce t sa t ha t aw t pwe t wc bw t data i/o address ce we bhe ,ble data in valid t hd t sd t sce t ha t aw t pwe t wc t bw t sa t lzwe t hzwe data i/o address ce we bhe ,ble data in valid notes 15. ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other combinations, ce is high. 16. data i/o is high impedance if oe or bhe , ble or both = v ih . 17. if ce goes high simultaneously with we going high, the output remains in a high impedance state. [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 9 of 13 figure 8. write cycle 3 (ble or bhe controlled) [18] truth table ce 1 ce 2 oe we ble bhe i/o 0 ? i/o 7 i/o 8 ? i/o 15 mode power hxxxxxhigh-z high-z power down standby (i sb ) xlxxxxhigh-z high-z power down standby (i sb ) l h l h l l data out data out read all bits active (i cc ) l h l h l h data out high-z read lower bits only active (i cc ) l h l h h l high-z data out read upper bits only active (i cc ) l h x l l l data in data in write all bits active (i cc ) l h x l l h data in high-z write lower bits only active (i cc ) l h x l h l high-z data in write upper bits only active (i cc ) l h h h x x high-z high-z selected, outputs disabled active (i cc ) switching waveforms (continued) t hd t sd t bw t sa t ha t aw t pwe t wc t sce data i/o address bhe ,ble we ce data in valid note 18. ce refers to the internal logical combination of ce 1 and ce 2 such that when ce 1 is low and ce 2 is high, ce is low. for all other combinations, ce is high. [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 10 of 13 ordering code definition ordering information speed (ns) ordering code package diagram package type operating range 12 CY7C1081DV33-12BAXI 001-50044 48-ball fbga (8 9.5 1.4 mm) (pb-free) industrial temperature range: x = i i = industrial package type: xxx = bax bax = 48-ball fbga (pb-free) speed: xx = 12 ns v33 = voltage range (3 v to 3.6 v) d = c9, 90 nm technology 1 = data width 16 bits 08 = 64-mbit density 1 = fast asynchronous sram family technology code: c = cmos 7 = sram cy = cypress c cy 1 v33 - xx xxx 7 08 1 d x [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 11 of 13 acronyms document conventions units of measure package diagram figure 9. 48-ball fbga (8 x 9.5 x 1.4 mm) (001-50044) 001-50044 *c acronym description cmos complementary metal oxide semiconductor fbga fine ball grid array i/o input/output sram static random access memory ttl transistor-transistor logic symbol unit of measure c degrees celsius ? a microamperes ma milliampere mhz megahertz ns nanoseconds pf picofarads v volts ? ohms w watts [+] feedback
cy7c1081dv33 document #: 001-53992 rev. *c page 12 of 13 document history page document title: cy7c1081dv33, 64-mbit (4 m 16) static ram document number: 001-53992 rev. ecn no. submission date orig. of change description of change ** 2746867 07/31/2009 v kn/aesa new datasheet *a 3100499 12/02/2010 pras updated note 14. changed datasheet status from preliminary to final. updated package diagram and sales, solutions, and legal information . added acronyms , document conventions and ordering code definition . *b 3178249 21/02/2011 pras post to external web *c 3246293 05/04/2011 pras modified figure 44-b all fbga pin configuration. [+] feedback
document #: 001-53992 rev. *c revised may 4, 2011 page 13 of 13 all product and company names mentioned in this document are the trademarks of their respective holders. cy7c1081dv33 ? cypress semiconductor corporation, 2009-2011. the information contained herein is subject to change without notice. cypress s emiconductor corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a cypress product. nor does it convey or imply any license under patent or other rights. cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement wi th cypress. furthermore, cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expect ed to result in significant injury to the user. the inclusion of cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies cypress against all charges. any source code (software and/or firmware) is owned by cypress semiconductor corporation (cypress) and is protected by and subj ect to worldwide patent protection (united states and foreign), united states copyright laws and international treaty provisions. cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the cypress source code and derivative works for the sole purpose of creating custom software and or firmware in su pport of licensee product to be used only in conjunction with a cypress integrated circuit as specified in the applicable agreement. any reproduction, modification, translation, compilation, or repre sentation of this source code except as specified above is prohibited without the express written permission of cypress. disclaimer: cypress makes no warranty of any kind, express or impl ied, with regard to this material, including, but not limited to, the implied warranties of merchantability and fitness for a particular purpose. cypress re serves the right to make changes without further notice to t he materials described herein. cypress does not assume any liability arising out of the application or use of any product or circuit described herein. cypress does not authori ze its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. the inclusion of cypress? prod uct in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies cypress against all charges. use may be limited by and subject to the applicable cypress software license agreement. sales, solutions, and legal information worldwide sales and design support cypress maintains a worldwide network of offices, solution center s, manufacturer?s representatives, and distributors. to find t he office closest to you, visit us at cypress locations . products automotive cypress.co m/go/automotive clocks & buffers cypress.com/go/clocks interface cypress. com/go/interface lighting & power control cypress.com/go/powerpsoc cypress.com/go/plc memory cypress.com/go/memory optical & image sensing cypress.com/go/image psoc cypress.com/go/psoc touch sensing cyp ress.com/go/touch usb controllers cypress.com/go/usb wireless/rf cypress.com/go/wireless psoc solutions psoc.cypress.com/solutions psoc 1 | psoc 3 | psoc 5 [+] feedback


▲Up To Search▲   

 
Price & Availability of CY7C1081DV33-12BAXI

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X